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APM 400 SI-PIN Precious Metal Analyzer

AGKEM’s APM 400 SI PIN Precious Metal XRF Analyzer is designed for fast, precise, and non-destructive analysis of precious metals, jewellery, alloys, and related samples. Equipped with a high-performance Si-PIN detector and a small Ø2.5 mm spot collimator, it supports detailed testing while requiring minimal sample preparation.

Key Features

Fast & Non-Destructive Testing
High-Performance Si-PIN Detector
Multi-Element Analysis
Jewellery & Karat Analysis
Alloy Identification
Refining Quality Control
Coating & Plating Applications
Weight: 38 kg

Categories: jewellery machines, Jewellery Testing Machine

Description
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Description

SIMPLY THE BEST
♦ Fast precise and non- destructive precious metals testing
♦ Completely non-destructive analysis, Minimum sample prepare needed
♦ Small spot collimator size ⱷ2.5 mm
♦ Analysis of all precious metals simultaneously including Au, Ag, Pt, Pd, Os, Ir, Ru, Rh, Re ,W, Cd, Cu, Ni
♦ HV power supply: 0~50KV
♦ Rated Power :<150w

♦ Test Sample : Solid/Liquid/Powder
♦ Quick and non-destructive karat and Jewelry compositional analysis with one push of a button
♦ Quickly and easily create result certificates
♦ Price cash-for-gold pieces quickly and accurately
♦ Identify and characterize a wide range of alloys and poison elements in jewelry samples
♦ Manage quality control of refining and melting operations
♦ More options for coating thickness measurement and plating solution analysis